User Rates
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MEASUREMENT
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USER RATES 2024 (TL)
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ULTRA FE-SEM
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1600 /sample
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EDS
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1100 /sample
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Carbon coating (for SEM)
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800 /cycle
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Gold coating (for SEM)
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1500 /cycle
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XPS
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3000 /hour
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XRF-standardless
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1900 /sample,
800 /fusion, 400 /pellet preparation
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XRD (All modes)
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XRD, GIXRD: 0-2 hours 1700,
After each hour 400,
Data evaluation: 1700 /hour,
XRR: 3000 /sample,
SAXS: 2500 /sample
D8 Discover stress texture orientation 4500 / sample
Stress texture topas data evaluation 4500 /sample
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ICP-MS
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ICP-MS: 1000 /sample
Laser Ablation: 4000 / day
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Microwave Digestion
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600 /sample
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UV-Vis-NIR
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Liquid sample & transparent film: 1000 /sample
Powder sample & opaque film: 1000 /sample
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Raman
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single spot 1000 /sample,
multiple spot 2500 /sample
DP 2600 /sample,
2D-map 3600 /sample
High Temperature 2700 /sample
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FTIR
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ATR mode 900 /sample,
FT-Raman mode 1400 /sample
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DLS (Size)
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1000 /sample
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Zeta Potential
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1000 /sample
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Isoelectric Point Det.
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3800 /sample
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AFM
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2700 /hour
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TXP
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2000 /sample
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T1C3X
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4000 /sample
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Epoxy resin & polishing
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Epoxy mould 600 /sample,
Grinding & Polishing 900 /hour
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Nanoindenter
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2400 / sample (for 15 measurements)
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BET
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Macro&Meso por. 2400 /sample,
Micro por. 3200 /sample
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Rheometer
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Strain scanning: 1000 /sample
Frequency scanning: 1000 /sample
Viscosity measurement: 1100 /sample
High Temperature Viscosity measurement: 1600 /sample
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Mercury Porosimetry
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4000 /sample
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CHNS-O
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1600 /sample
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PVD systems
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2400 /hour + target and crucible fee excluded
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FLS 1000 photoluminescence
spectrometer
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Visible emission: 1100 /hour
Visible lifetime: 1400 /hour
Infrared emission: 1400 /hour
Infrared lifetime: 1400 /hour
Measurements w./ cryostat: 2400 /measurement
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Transient Absorption Spectroscopy
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3200 /hour (fs & ns, from UV-Mid IR)
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| Tunable OPA | 2200 /hour |
| Microfabrication bench |
1800 /hour
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| Photoluminescence spectrometer (PL) | 900 /sample |
| Laser Power Performance characterization | 2400 /hour |
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Stereo microscope
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800 /sample
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Technical report
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Will be charged when required.
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VAT excluded. Academic discount for other university research groups is 25%.
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