THERMO K-ALPHA X-RAY PHOTOELECTRON SPECTROMETER

APPLICATIONS

X-ray Photoelectron Spectroscopy (XPS) is an analytical technique that detects the characteristic electrons ejected from the surface of a sample. Elements from Li to U can be detected. The technique is highly surface sensitive – the typical detection depth is ~5 nm – and can detect light elements such as Si (Z =14) and below at about 1% of the total surface composition and heavier elements down to ~0.1 % with an accuracy of 20 – 50 percent of the given value.

 Dry samples of solid, powders and thin fil

ZEISS ULTRA PLUS FIELD EMISSION SCANNING ELECTRON MICROSCOPE

APPLICATIONS

High Resolution Imaging for dry samples. Opportunity to work with insulating samples without coating.

EDS Elemental Analysis available

 Dry solid, powder materials

ZEISS EVO LS15 SCANNING ELECTRON MICROSCOPE

APPLICATIONS

Surface morphology, opportunity to work with dry and wet samples under higher pressure (3000 Pa) without coating

EDS Elemental Analysis available

RENISHAW INVIA – RAMAN MICROSCOPE

APPLICATIONS

Surface mapping and depth profile analysis with the Raman signal.
Equipped with 785nm, 633nm, 532nm excitation laser sources.
Temperature control between -196 °C and +200 °C.

Measurements with solid, liquid, powder, thin film samples

BRUKER D8 ADVANCE X-RAY DIFFRACTOMETER

APPLICATIONS

Powder Diffraction

Small Angle X-ray Scattering

Grazing Incidence X-ray Diffraction

X-ray Reflectometry

Texture

Stress-Strain

 Samples: Powder, thin film, fiber, bulk

BRUKER D8 DISCOVER X-RAY DIFFRACTION SYSTEM

APPLICATIONS

Texture identification, residual stress analysis

BRUKER TIGER S8 X-RAY FLUORESCENCE SPECTROMETER

APPLICATIONS

 Wavelength Dispersive X-ray Fluorescence Spectrometer

Trace elemental Analysis from Boron to Uranium

 Ability to operate with solid, liquid, powder samples

Opportunity to prepare fused beads and pressed pellets in the sample preparation room
(40 tons press, mill, Fluxana fusion system)

BRUKER D2 PHASER – X-RAY DIFFRACTOMETER

APPLICATIONS

Analysis of the crystal structure

 For samples of powder and thin films

Thermo Scientific Flash 2000

APPLICATIONS

Organic CHNS/O elemental analysis

Micromeritics ASAP 2020 HD Accelerated Surface Area  and Porosimetry analyzer

APPLICATIONS

BET  surface area analysis

Thermo Scientific iS10 FT-IR

APPLICATIONS

650-4000 cm-1, single reflection diamond ATR

SHIMADZU UV-3600 – UV-VIS-NIR SPECTROPHOTOMETER

APPLICATIONS

Absorption, % Transmission, Diffused and specular Reflection, Thickness measurements (185- 3300 nm wavelength)

Temperature control is available for liquid samples

Solid, liquid, powder, thin film analysis

Agilent 7700x ICP-MS

APPLICATIONS

Sensitive elemental analysis,
collision and reaction cell

Teledyne CETAC LSX-213 G2+ Laser Ablation

APPLICATIONS

HelEx sampling cell for ICP-MS

Bruker Dimension Icon AFM

APPLICATIONS

Measurement in air and water, all modes, temperature control, modulus measurement

NANOMAGNETICS ATOMIC FORCE MICROSCOPE

APPLICATIONS

 Surface Topography, surface roughness

Magnetic Topography Best for surfaces and thin films

Agilent G200 Nano Indenter

APPLICATIONS

Nanoindentation  system,  continuous
stiffness measurement,  surface scan  and express test applications

Spectra Physics Mai-Tai

APPLICATIONS

84 MHz femtosecond Titanium: Sapphire oscillator, 780-820 nm, 400 mW

Spectra Physics Spitfire Ace

APPLICATIONS

1 kHz 100 fs Titanium: Sapphire amplifier, 800 nm, 4 mJ

 

Ultrafast Systems HELIOS

APPLICATIONS

Femtosecond transient absorption spectrometer

Newport Z-scan

APPLICATIONS

Non-linear absorption properties

Newport uFab Work Station

APPLICATIONS

Microfabrication system, material and surface processing system

 

Amptek X-123SSD X-Ray Spectrometer

APPLICATIONS

1 – 40 keV range, 125 eV FWHM resolution

Amptek X-CdTe123 X-Ray Spectrometer

APPLICATIONS

5 – 150 keV range, 650 eV FWHM resolutio

Edinburgh Instruments FLS1000 Spectrometer

APPLICATIONS

Emission and excitation measurements, absorbance analysis, and kinetic measurements
Wavelength range between 200 nm and 5500 nm
Time-resolved measurements from nanoseconds to seconds
Light sources: Continuous-wave and microsecond xenon lamps, picosecond pulsed lasers (377 nm, 444 nm, 635 nm, 785 nm, and 980 nm)
Integrating sphere option for quantum yield measurements
77K Cryostat option

AGILENT CARY ECLIPSE – PL

APPLICATIONS

Excitation and emission spectra measurements.

  Fluorescence, phosphorescence, chemi/bio-luminescence,

and time resolved phosphorescence measurements.

Wavelength range: 200-900 nm.

Measurement opportunity with PCB 1500 Peltier (10-70 Celsius).

Ability to operate with solid, liquid, powder samples

Olympus IX-81 inverted fluorescence microscope

APPLICATIONS

High resolution epifluorescence imaging

Sample Preparation Systems

APPLICATIONS

40 tons press, mill

Fluxana fusion system

Li-Cor Odyssey CLx

APPLICATIONS

Western Blot imaging system

Agilent Cary Eclipse PL:

APPLICATIONS

Excitation and emission spectra measurements.
Fluorescence, phosphorescence, chemi/bio-luminescence, and time
resolved phosphorescence measurements.

MALVERN ZS – ZETASIZER

APPLICATIONS

Ability to measure hydrodynamic particle size and distribution between 0.3nm-10μm

T-control, pH control while measuring

 For liquid dispersions or emulsions

MALVERN KINEXUS – RHEOMETER

APPLICATIONS

Viscosity measurements between 0.05 μNm-200mNm torque in a T-controlled environmentSolutions, pastes

KSV NIMA – MULTI VESSEL DIP COATER

APPLICATIONS

Multi-layer coating with a pre-defined program

For coating and surface modification

KSV NIMA – LANGMUIR AND LANGMUIR BLODGETT DEPOSITION TROUGHS

APPLICATIONS

Single Layer film preparation system
Coating, surface modification

MTI-Spin Coater VTC-100:

APPLICATIONS

Spin coating system,

surface modifications,
coating

Twin Screw Extruder

APPLICATIONS

Polymer and composite sample preparation

Gold and carbon coating systems for SEM

APPLICATIONS

Conductive coating for SEM analysis

Leica TXP

APPLICATIONS

Cross-sectioning and polishing system

Leica TIC 3X

APPLICATIONS

Argon ion beam slope cutter system

Micromeritics Autopore IV Mercury Porosimeter

APPLICATIONS

60,000 psi mercury porosimeter

Thermo Scientific iS50 FT-IR

APPLICATIONS

50-12000 cm-1, step-scan, PM-IRRAS/FT-VCD Module, FT-Raman module,
single and multiple reflection ATR

Bruker Contour GT-K0 3B  White Light Profilometer

APPLICATIONS

0.1 nm – 10 mm contactless surface topography

Protherm furnace

APPLICATIONS

Polishing system

APPLICATIONS

MTI Optical Microscope

APPLICATIONS

Cutting system

APPLICATIONS

Buehler VibroMet 2 Vibratory Polisher

APPLICATIONS

NANOVAK PHYSICAL VAPOR DEPOSITION

APPLICATIONS

High Vacuum Thermal Evaporator
RF and DC plasma sputter coatingCoating of electrically conductive or dielectric materials

Nanovak NVBJ-300TH

APPLICATIONS

Thermal vapor deposition for high vapor pressure metals

Europlasma Junior Microwave Plasma

APPLICATIONS

2.45 GHz plasma system, argon, oxygen, nitrogen and mixtures

Oxford Reactive Ion Etching  (RIE)

APPLICATIONS

Silicon and dielectric etching

Mori Seiki NMV5000 DCG

APPLICATIONS

Excitation and emission spectra measurements. Fluorescence, phosphorescence, chemi/bio-luminescence, and time resolved phosphorescence measurements. Wavelength range: 200-900 nm. Measurement opportunity with PCB 1500 Peltier (10-70 Celsius). Ability to operate with solid, liquid, powder sample

Spectra Physics TOPAS OPA (x2)

APPLICATIONS

1 kHz 100 fs, 200-2600 nm