X-ray Photoelectron Spectroscopy (XPS) is an analytical technique that detects the characteristic electrons ejected from the surface of a sample. Elements from Li to U can be detected. The technique is highly surface sensitive – the typical detection depth is ~5 nm – and can detect light elements such as Si (Z =14) and below at about 1% of the total surface composition and heavier elements down to ~0.1 % with an accuracy of 20 – 50 percent of the given value.

 Dry samples of solid, powders and thin films

Contact person: Dr. Barış Yağcı (byagci@ku.edu.tr)

High Resolution Imaging for dry samples. Opportunity to work with insulating samples without coating.

EDS Elemental Analysis available

 Dry solid, powder materials

Contact person: Dr. Barış Yağcı (byagci@ku.edu.tr)

Surface morphology, opportunity to work with dry and wet samples under higher pressure (3000 Pa) without coating

EDS Elemental Analysis available

Contact person: Dr. Barış Yağcı (byagci@ku.edu.tr)

Surface mapping and depth profile analysis with the Raman signal.
Equipped with 785nm, 633nm, 532nm excitation laser sources.
Temperature control between -196 °C and +200 °C.

Measurements with solid, liquid, powder, thin film samples

Contact person: Dr. Gülsu Şimşek Franci (gusimsek@ku.edu.tr)

Powder Diffraction

Small Angle X-ray Scattering

Grazing Incidence X-ray Diffraction

X-ray Reflectometry

Texture

Stress-Strain

 Samples: Powder, thin film, fiber, bulk

Contact person: Dr. Hadi Jahangiri (hjahangiri@ku.edu.tr )

Texture identification, residual stress analysis

Contact person: Dr. Hadi Jahangiri (hjahangiri@ku.edu.tr )

 Wavelength Dispersive X-ray Fluorescence Spectrometer

Trace elemental Analysis from Boron to Uranium

 Ability to operate with solid, liquid, powder samples

Opportunity to prepare fused beads and pressed pellets in the sample preparation room
(40 tons press, mill, Fluxana fusion system)

Contact person: Dr. Gülsu Şimşek Franci (gusimsek@ku.edu.tr)

Analysis of the crystal structure

 For samples of powder and thin films

Contact person: Dr. Hadi Jahangiri (hjahangiri@ku.edu.tr )

Organic CHNS/O elemental analysis

Contact person: Dr. Barış Yağcı (byagci@ku.edu.tr)

BET  surface area analysis

Contact person: Dr. Amir Motallebzadeh (amotallebzadeh@ku.edu.tr)

650-4000 cm^-1, single reflection diamond ATR

Contact person: Dr. Gülsu Şimşek Franci (gusimsek@ku.edu.tr)

Absorption, % Transmission, Diffused and specular Reflection, Thickness measurements (185- 3300 nm wavelength)

Temperature control is available for liquid samples

Solid, liquid, powder, thin film analysis

Contact person: Dr. Hadi Jahangiri (hjahangiri@ku.edu.tr )

Sensitive elemental analysis,
collision and reaction cell

Contact person: Dr. Gülsu Şimşek Franci (gusimsek@ku.edu.tr)

HelEx sampling cell for ICP-MS

Contact person: Dr. Gülsu Şimşek Franci (gusimsek@ku.edu.tr)

Sample preparation for ICP-MS

Contact person: Dr. Gülsu Şimşek Franci (gusimsek@ku.edu.tr)

Measurement in air and water, all modes, temperature control, modulus measurement

Contact person: Dr. Amir Motallebzadeh (amotallebzadeh@ku.edu.tr)

 Surface Topography, surface roughness

Magnetic Topography Best for surfaces and thin films

Contact person: Dr. Amir Motallebzadeh (amotallebzadeh@ku.edu.tr)

Nanoindentation  system,  continuous
stiffness measurement,  surface scan  and express test applications

Contact person: Dr. Amir Motallebzadeh (amotallebzadeh@ku.edu.tr)

84 MHz, femtosecond, Ti:sapphire laser, tunable between 780-820 nm with 400 mW of output power.

Contact person: Dr. Yağız Morova (yamorova@ku.edu.tr)

1 kHz100-fs, 1-kHz, ultrafast laser amplifer operating at 800 nm with 4 mJ of output energy.

Contact person: Dr. Yağız Morova (yamorova@ku.edu.tr)

Ultrafast transient absorption experiments. EOS: probe spectral range: 360-900 nm and 800-1600 nm. temporal range: from nanoseconds to seconds. spectral resolution: 1.5 nm for visible, 3.5 nm for near-infrared wavelengths.
temporal resolution: 600-800 ps depending on the probe light source. pump source: tunable OPA
Helios: probe spectral range: 350-750 nm, 450-800 nm, and 800-1600 nm. OPA can also be used as probe source for two-color pump probe experiments.
temporal range: 100 fs to 3.3 ns. spectral resolution: 1.5 nm for visible, 3.5 nm for near-infrared wavelengths. temporal resolution: delay stage resolution 14 fs. pump source: tunable OPA

Contact person: Dr. Hadi Jahangiri (hjahangiri@ku.edu.tr )

Nonlinear absorption measurements.
Excitation source: tunable OPA.
Computer-controlled translation stages.
Travel range: 250 mm.
Minimum incremental motion: 1 um.

Contact person: Dr. Yağız Morova (yamorova@ku.edu.tr)

Material (glass, polymer, metal, semiconductor etc.) processing. 3D microfabrication by two-photon polymerization. Ablation of glass, polymer, metal, and ceramics. Volume writing of waveguides and microfluidics. Nano surgery for in vivo sub-cellular investigations in model organisms. Surface modification.
Laser source: 100-fs, 1-kHz, 800 nm.
Resolution: sub-micron when using objectives, 10-20 um when using simple lenses.
Computer controlled laser power.
Computer controlled 3D motion.
Total XYZ travel distance: 100 mm x 100 mm x 5 mm with 0.05 um resolution.
Maximum XY speed: 300 mm/s.
Real-time monitoring with a camera.

Contact person: Dr. Yağız Morova (yamorova@ku.edu.tr)

1 – 40 keV range, 125 eV FWHM resolution

Contact person: Dr. Yağız Morova (yamorova@ku.edu.tr)

5 – 150 keV range, 650 eV FWHM resolution

Contact person: Dr. Yağız Morova (yamorova@ku.edu.tr)

High resolution epifluorescence imaging

1) 40 tons press, mill

2) Fluxana fusion system

Contact person: Dr. Gülsu Şimşek Franci (gusimsek@ku.edu.tr)

Western Blot imaging system

Excitation and emission spectra measurements.
Fluorescence, phosphorescence, chemi/bio-luminescence, and time
resolved phosphorescence measurements.

Contact person: Dr. Yağız Morova (yamorova@ku.edu.tr)

Ability to measure hydrodynamic particle size and distribution between 0.3nm-10μm

T-control, pH control while measuring

 For liquid dispersions or emulsions

Contact person: Dr. Barış Yağcı (byagci@ku.edu.tr)

Viscosity measurements between 0.05 μNm-200mNm torque in a T-controlled environmentSolutions, pastes

Contact person: Dr. Hadi Jahangiri (hjahangiri@ku.edu.tr )

Multi-layer coating with a pre-defined program

For coating and surface modification

Contact person: Dr. Barış Yağcı (byagci@ku.edu.tr)

Single Layer film preparation system
Coating, surface modification

Contact person: Dr. Barış Yağcı (byagci@ku.edu.tr)

Spin coating system,

surface modifications,
coating

Contact person: Dr. Barış Yağcı (byagci@ku.edu.tr)

Polymer and composite sample preparation

Conductive coating for SEM analysis

Contact person: Dr. Barış Yağcı (byagci@ku.edu.tr)

Cross-sectioning and polishing system

Contact person: Dr. Barış Yağcı (byagci@ku.edu.tr)

Argon ion beam slope cutter system

Contact person: Dr. Barış Yağcı (byagci@ku.edu.tr)

60,000 psi mercury porosimeter

Contact person: Dr. Barış Yağcı (byagci@ku.edu.tr)

50-12000 cm^-1, step-scan, PM-IRRAS/FT-VCD Module, FT-Raman module,
single and multiple reflection ATR

Contact person: Dr. Gülsu Şimşek Franci (gusimsek@ku.edu.tr)

0.1 nm – 10 mm contactless surface topography

Contact person: Dr. Amir Motallebzadeh (amotallebzadeh@ku.edu.tr)

Contact person: Dr. Amir Motallebzadeh (amotallebzadeh@ku.edu.tr)

Contact person: Dr. Amir Motallebzadeh (amotallebzadeh@ku.edu.tr)

Macroscopic examination, max 55x with std objective (2x objective available, 110x max), 10 MP camera, video recording possible

Contact person: Dr. Gülsu Şimşek Franci (gusimsek@ku.edu.tr)

Contact person: Dr. Amir Motallebzadeh (amotallebzadeh@ku.edu.tr)

Contact person: Dr. Amir Motallebzadeh (amotallebzadeh@ku.edu.tr)

High Vacuum Thermal Evaporator
RF and DC plasma sputter coatingCoating of electrically conductive or dielectric materials

Contact person: Dr. Amir Motallebzadeh (amotallebzadeh@ku.edu.tr)

Thermal vapor deposition for high vapor pressure metals

Contact person: Dr. Amir Motallebzadeh (amotallebzadeh@ku.edu.tr)

2.45 GHz plasma system, argon, oxygen, nitrogen and mixtures

Contact person: Dr. Amir Motallebzadeh (amotallebzadeh@ku.edu.tr)

Silicon and dielectric etching

Excitation and emission spectra measurements. Fluorescence, phosphorescence, chemi/bio-luminescence, and time resolved phosphorescence measurements. Wavelength range: 200-900 nm. Measurement opportunity with PCB 1500 Peltier (10-70 Celsius). Ability to operate with solid, liquid, powder sample

Femtosecond, 1-kHz optical parametric amplifier (OPA), tunable between 200 and 2600 nm.
High-power excitation of solid and liquid samples for different applications. Pump and probe sources for ultrafast transient absorption experiments.

Contact person: Dr. Yağız Morova (yamorova@ku.edu.tr)